DocumentCode
33928
Title
Monolithic Integration of Surface Plasmon Detector and Metal–Oxide–Semiconductor Field-Effect Transistors
Author
Alhara, Takuma ; Fukuhara, Masashi ; Takeda, Akiko ; Byounghyun Lim ; Futagawa, Masato ; Ishii, Y. ; Sawada, Kazuaki ; Fukuda, Motohisa
Author_Institution
Dept. of Electr. & Electron. Inf. Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
Volume
5
Issue
4
fYear
2013
fDate
Aug. 2013
Firstpage
6800609
Lastpage
6800609
Abstract
The monolithic integration of a silicon-based plasmonic detector with metal- oxide-semiconductor field-effect transistors (MOSFETs) was demonstrated. The plasmonic detector consisted of a gold film with a nanoslit grating on a silicon substrate and was operated at a free-space wavelength of 1550 nm. The structure of the nanoslit grating was optimized by using the finite-difference time-domain method. The output current from the plasmonic detector was amplified by ~14 000 times using the monolithically integrated MOSFETs. In addition, dynamic operation of the integrated circuit was demonstrated by modulation of the intensity of a beam that was incident to the plasmonic detector.
Keywords
MOSFET; elemental semiconductors; finite difference time-domain analysis; gold; metallic thin films; monolithic integrated circuits; nanosensors; silicon; surface plasmons; Au-Si; Si; beam intensity modulation; finite-difference time-domain method; free-space wavelength; gold film; integrated circuit; metal-oxide-semiconductor field-effect transistors; monolithic integration; monolithically integrated MOSFET; nanoslit grating; silicon substrate; silicon-based plasmonic detector; surface plasmon detector; Detectors; Gold; Gratings; MOSFET; Optical detectors; Plasmons; Silicon; Schottky barrier; Surface plasmon polariton; diffraction grating; metal-oxide-semiconductor field-effect transistor; nano-slit;
fLanguage
English
Journal_Title
Photonics Journal, IEEE
Publisher
ieee
ISSN
1943-0655
Type
jour
DOI
10.1109/JPHOT.2013.2272779
Filename
6557472
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