Title :
A systems approach to downsize ATE
Author :
Goyal, Ramesh C.
Author_Institution :
John Fluke Manuf. Co. Inc., Everett, WA, USA
Abstract :
It has been demonstrated that the size of traditional ATE (automatic test equipment) systems can be reduced significantly by using modular instruments and an open system architecture called the VXIbus, which solves many problems experienced by the ATE system builders. The VXIbus architecture allows significant reduction in the footprint of the traditional rack-and-stack ATE systems. In addition, the VXIbus offers significant advantages in the area of addressing instrument functions, message-passing, time synchronization, power-on initialization and diagnostics, and system throughput. The VXIbus combines multivendor computer and instrumentation functions into a common mainframe and supports interchangeability and interoperability
Keywords :
automatic test equipment; computer interfaces; ATE; VXIbus; addressing; computer interfaces; diagnostics; interchangeability; interoperability; message-passing; modular instruments; open system architecture; power-on initialization; system throughput; time synchronization; Analog-digital conversion; Circuit testing; Computer architecture; Control systems; Instruments; Power supplies; Size control; Space technology; System testing; Timing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81097
