DocumentCode :
3393118
Title :
Investigation of Q enhancement for inductors processed in BiCMOS technology
Author :
Chen, Yi-Jan E. ; Heo, Deukhyoun ; Laskar, Joy ; Anderson, Thomas
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1999
fDate :
1999
Firstpage :
263
Lastpage :
266
Abstract :
This paper reports the investigation of the quality factor (Q) enhancement approaches for on-chip spiral inductors which can be implemented without modifying standard CMOS/BiCMOS processes. These approaches include multilevel metal cascade, multilevel metal shunt, patterned ground shield, and tapered trace width. To make the comparison consistent, the effective inductance of all inductors is designed to be 5 nH at 1 GHz. This work shows that multilevel metal shunt is the most effective method to increase the Q below 2.3 GHz. The multilevel metal cascade can also improve the Q up to 10% below 3.4 GHz and reduce the inductor area by half. The tapered width inductor has the highest Q above 2.1 GHz, but its equivalent inductance is reduced by 30%. All of these approaches improve the Q by sacrificing the self-resonant frequency, so the single metal spiral inductor is more suitable for the applications above 3.4 GHz
Keywords :
BiCMOS integrated circuits; Q-factor; UHF integrated circuits; inductors; integrated circuit technology; microwave integrated circuits; 1 GHz; 2.1 GHz; 2.3 GHz; 3.4 GHz; BiCMOS technology; CMOS/BiCMOS processes; Q factor enhancement; SHF; effective inductance; equivalent inductance; inductor area reduction; multilevel metal cascade; multilevel metal shunt; on-chip spiral inductors; patterned ground shield; self-resonant frequency; tapered trace width; tapered width inductor; BiCMOS integrated circuits; CMOS technology; Frequency; Inductance; Inductors; Integrated circuit technology; Q factor; Radiofrequency integrated circuits; Shunt (electrical); Spirals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio and Wireless Conference, 1999. RAWCON 99. 1999 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5454-0
Type :
conf
DOI :
10.1109/RAWCON.1999.810981
Filename :
810981
Link To Document :
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