DocumentCode :
3393538
Title :
The two level maintenance-I level dilemma
Author :
Kornreich, Stuart
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
63
Lastpage :
66
Abstract :
Previous attempts at implementing the two-level maintenance philosophy for Navy aircraft did not prove to be workable, and an `I´ level capability was added at a later stage in at least one major program. In this work, an attempt is made to define the real requirements for a workable two-level system, and some actual cases of what can be done on some major weapon systems in the Navy are shown. Recommendations on how to implement and test for a working weapon system BIT/BITE (built-in-test/built-in-test equipment) are offered along with some criteria to measure success. Additionally, related issues such as design for testability and repair capability are addressed since these items can easily take a back seat or be omitted entirely when driving hard to a two-level maintenance concept
Keywords :
aircraft instrumentation; automatic test equipment; electronic equipment testing; maintenance engineering; military systems; ATE; BIT/BITE; Navy aircraft; avionics; built-in-test equipment; design for testability; electronic equipment testing; repair; two-level maintenance; weapon systems; Aerospace electronics; Circuit faults; Contracts; Costs; History; Military aircraft; Packaging; Pipelines; Testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81100
Filename :
81100
Link To Document :
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