DocumentCode :
3393714
Title :
Quality challenges of the nanometer design realm
Author :
Vucurevich, Ted
Author_Institution :
Cadence Design Systems,Inc.
fYear :
2003
fDate :
24-26 March 2003
Firstpage :
25
Lastpage :
25
Keywords :
Circuits; Convergence; Design automation; Footwear; Geometry; Laboratories; Prototypes; System-on-a-chip; Wires; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-1881-8
Type :
conf
DOI :
10.1109/ISQED.2003.1194704
Filename :
1194704
Link To Document :
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