Title :
Quality challenges of the nanometer design realm
Author_Institution :
Cadence Design Systems,Inc.
Keywords :
Circuits; Convergence; Design automation; Footwear; Geometry; Laboratories; Prototypes; System-on-a-chip; Wires; Wiring;
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-1881-8
DOI :
10.1109/ISQED.2003.1194704