• DocumentCode
    3394144
  • Title

    A Precise Location Method of Power Quality Disturbances Based on Morphological Edge Detection

  • Author

    Huang Runhong ; Ouyang Sen ; Shi Yili

  • Author_Institution
    Sch. of Electr. Power, South China Univ. of Technol., Guangzhou, China
  • fYear
    2012
  • fDate
    27-29 March 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A precise location method of power quality disturbances was proposed to solve the background gradient problems originated from the periodic changes of power signals and the existing of various interferences in the process of sampling. The proposed method includes the adaptive selection of structuring element (SE) for morphological filter by using signal to noise ratio (SNR) as a standard to assess the filtering effect, Top-Hat transform of morphological gradient (MG) which is introduced to suppress background gradient, and the soft- thresholding quantitative method. The preliminary location results are achieved by Top-Hat transform of morphological gradient and the final location results are determined by the soft-thresholding values. Simulations of a variety of power quality disturbances have been carried out, which shows its enhanced location precision, outstanding anti- jamming ability and universal applicability.
  • Keywords
    edge detection; jamming; power distribution faults; power supply quality; transforms; MG; SE; SNR; Top-Hat transform; adaptive selection; antijamming ability; background gradient problem; morphological edge detection; morphological filter; morphological gradient; power quality disturbance; power signal; precise location method; preliminary location results; signal-to-noise ratio; soft-thresholding quantitative method; structuring element; universal applicability; Image edge detection; Morphology; Power quality; Voltage fluctuations; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2012 Asia-Pacific
  • Conference_Location
    Shanghai
  • ISSN
    2157-4839
  • Print_ISBN
    978-1-4577-0545-8
  • Type

    conf

  • DOI
    10.1109/APPEEC.2012.6307419
  • Filename
    6307419