DocumentCode :
3394293
Title :
Digital Maintenance Information (DMI) system
Author :
Knapp, Phillip M.
Author_Institution :
AAI Corp., Hunt Valley, MD, USA
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
138
Lastpage :
145
Abstract :
The objective of the digital maintenance information (DMI) system is to improve the capabilities of maintenance organization by providing generic techniques with an integrated electronic deliverable information system for use with ATE (automatic test equipment). The system integrates multiple maintenance information sources into a single easy-to-use information system. Integrated diagnostics relative to ATE has focused on the improved operator interfaces, embedded training, maintenance aiding, information handling and presentation, and documentation. The author presents a system which integrates these functions into a DMI system. The primary application is the presentation of video, graphic, schematic, and instructional text and data in the form of interactive scripts which are displayed to the ATE operator in a PC environment. These scripts visually demonstrate operator support functions during testing including unit-under-test hookup, alignment and adjustment procedures, probing steps, and repair actions. Embedded training in the use of the system, online help, DMI diagnostics, heuristic data collection and retrieval, and electronic network analysis aides are provided using an integrated expert system
Keywords :
automatic test equipment; electronic engineering computing; electronic equipment testing; expert systems; maintenance engineering; management information systems; ATE; DMI diagnostics; PC environment; adjustment; alignment; digital maintenance information; electronic network analysis; embedded training; heuristic data collection; integrated electronic deliverable information system; integrated expert system; online help; probing; repair; retrieval; unit-under-test hookup; Artificial intelligence; Automatic testing; Diagnostic expert systems; Document handling; Documentation; Graphics; Information systems; Speech recognition; Speech synthesis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81111
Filename :
81111
Link To Document :
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