Title :
On the evaluation of real life test expert systems
Author :
Ben-Bassat, Mosha ; Ben-Aire, D. ; Ben-Zvi, Inna ; Beniaminy, Israel ; Cheifetz, J. ; Horovitz, Oren ; Sela, Mordechai ; Shalev, Michal
Author_Institution :
Intelligent Electron. Inc., Tel Aviv, Israel
Abstract :
The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; expert systems; maintenance engineering; real-time systems; AITEST expert system; ATE; UUT; aerospace; artificial intelligence software; automatic test equipment; automotive; communication; computers; electronic troubleshooting; embedding; instrumentation; military; peripherals; real life test expert systems; service management; unit under test; universal knowledge bases; Aerospace testing; Artificial intelligence; Automatic test equipment; Electronic switching systems; Expert systems; Instruments; Life testing; Military computing; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81113