DocumentCode :
3394339
Title :
Portability issues in MATE software
Author :
Koppel, David
Author_Institution :
AIS Syst. Inc., Jericho, NY, USA
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
155
Lastpage :
160
Abstract :
The MATE software has been ported onto a variety of different computer architectures under a number of different operating systems. Several of these projects are taken as case studies to illustrate the difficulties encountered and the techniques used to deal with them. Four types of projects are considered: rehosting the MOS (MATE operating system) to a new 1750 A platform with various peripheral suites (systems have been Multibus based and VMEbus based); porting the MTE (MATE test executive) to a VAX/VHS environment; porting the MAC (MATE ATLAS compiler), MOLE (MATE on-line editor), and MTE to a 80286/Xenix environment; and porting the MAC, MOLE, and MTE to a 80286/DOS environment. Each project is analyzed in terms of work inherently necessary by the nature of the task, work made necessary by peculiarities in the target environment, and work associated with the development environment. Timesaving techniques used during development are highlighted. A special subsection is included which discusses the advantages that could have been realized had the original work been done in Ada. The application of Ada in the port process is also discussed
Keywords :
Ada; automatic test equipment; computer interfaces; operating systems (computers); programming environments; project support environments; software portability; 80286/DOS environment; 80286/Xenix environment; ATE; Ada; MATE ATLAS compiler; MATE on-line editor; MATE operating system; MATE software; MATE test executive; MOLE; MOS; Multibus; VAX/VHS environment; VMEbus; software portability; Application software; Computer aided instruction; Computer architecture; Computer peripherals; Control systems; File systems; Operating systems; Program processors; System testing; Voice mail;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81114
Filename :
81114
Link To Document :
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