• DocumentCode
    3394393
  • Title

    Neural networks in automatic testing of diode protection circuits

  • Author

    Allred, Lioyd G.

  • Author_Institution
    Ogden Air Logistics Center, Hill AFB, UT, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    Limiting Zener diode circuits are often used in ground support equipment for the Minuteman Missile. These circuits protect sensitive transistor and resistor components from electrical surges. Data were collected for 110 waveforms for a combination of good circuits and the most frequently encountered failure modes, including shorted diodes, open diodes and bad amplifiers. The data were then used to train a neural network pattern recognition system to see if neural network technology could correctly identify good versus bad protection circuits. When trained using all of the diodes, the neural network was able to identify correctly all of the circuits and associated failure models. To validate the neural network model, a subset of 59 samples was randomly selected for training of the neural network, and the remaining 51 samples were used for testing. In both instances, the network did an excellent job (100%) of identifying failure
  • Keywords
    Zener diodes; automatic test equipment; automatic testing; computerised pattern recognition; electronic equipment testing; fault location; ground support equipment; limiters; military equipment; missiles; neural nets; protection; ATE; Minuteman Missile; Zener diode circuits; automatic testing; diode protection circuits; electrical surges; failure models; ground support equipment; limiter; neural network; pattern recognition; training; waveforms; Automatic testing; Circuit testing; Diodes; Feature extraction; Ground support; Intelligent networks; Neural networks; Protection; Recycling; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81118
  • Filename
    81118