DocumentCode :
3394463
Title :
Providing Ada based test program and soft panel instrument controls
Author :
Ziegler, Jehuda ; Grasso, Jerry M. ; Burgermeister, Linda G. ; Mollod, Leonard D.
Author_Institution :
ITT Avionics, Nutley, NJ, USA
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
187
Lastpage :
194
Abstract :
The capabilities of the Universal Ada Test Language (UATL) have been expanded. The UATL was rehosted to an HP Model 9000/Series 300 processor, and a set of test program generation and soft panel instrument control functions were added. HP´s interactive test generator (ITG) includes ASCII instrument driver files that characterize the instrument functions and define interactive soft-panel control screens for developing test programs in BASIC. UATL/Ada-based instrument and operator screen control procedures have been written that provide similar functions for generating test programs in Ada. UATL provides a complete set of test support functions in Ada for performing closed-loop testing of a unit-under-test through its external interfaces. In addition to the instrument control functions, the UATL provides real-time digital stimulus/response controls over software or hardware interfaces, online test control and performance monitoring, data recording, and both ASCII and graphical data reduction. Ada introduces the advantages of portability and reusability, extensive data consistency checking, and built-in multitasking support
Keywords :
Ada; automatic programming; automatic test equipment; interactive programming; real-time systems; software portability; software reusability; ASCII instrument driver files; BASIC; HP Model 9000/Series 300 processor; Universal Ada Test Language; built-in multitasking support; closed-loop testing; data consistency checking; interactive soft-panel control screens; interactive test generator; portability; real-time digital stimulus/response controls; reusability; soft panel instrument controls; test program generation; Aerospace electronics; Automatic control; Automatic testing; Computer graphics; Displays; Hardware; Instruments; Packaging; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81119
Filename :
81119
Link To Document :
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