DocumentCode :
3394594
Title :
Energy Dispersive Spectrometer Analysis of AC Aged Zinc-Oxide Varistors
Author :
Zenghui Zheng ; Qian Wang ; Hang Cui ; Youping Tu
Author_Institution :
Beijing Key Lab. of High Voltage&EMC, North China Electr. Power Univ., Beijing, China
fYear :
2012
fDate :
27-29 March 2012
Firstpage :
1
Lastpage :
3
Abstract :
Aging performance decides the long-term stable operation of ZnO varistors. This paper applied the Scanning Electron Microscope (SEM) to determine the elements distribution inside ZnO varistors before and after ac aging, based on the Energy Dispersive Spectrometer (EDS) analysis, which consists of point analysis, line scan analysis, and mapping analysis. From experimental results, we can conclude that the combination of mapping analysis and line scan analysis can provide a relatively accurate elements distribution. The line scan analysis on ZnO varistors after aging shows that the distribution of zinc changes a lot along grain boundaries in ZnO varistors after aging test, and zinc accumulates along the boundary, which accounts for the migration of zinc ions. This result can provide fundament to determine the aging mechanism of ZnO varistors.
Keywords :
II-VI semiconductors; ageing; power semiconductor devices; scanning electron microscopes; varistors; zinc compounds; AC aged varistors; EDS; SEM; ZnO; elements distribution; energy dispersive spectrometer analysis; line scan analysis; mapping analysis; point analysis; scanning electron microscope; Aging; Bismuth; Degradation; Grain boundaries; Varistors; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2012 Asia-Pacific
Conference_Location :
Shanghai
ISSN :
2157-4839
Print_ISBN :
978-1-4577-0545-8
Type :
conf
DOI :
10.1109/APPEEC.2012.6307439
Filename :
6307439
Link To Document :
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