DocumentCode
33947
Title
Theory of Nanosecond High-Power Microwave Breakdown on the Atmosphere Side of the Dielectric Window
Author
Meng Zhu ; Chao Chang ; Kai Yan ; Chunliang Liu ; Changhua Chen
Author_Institution
Sci. & Technol. on High Power Microwave Lab., Northwest Inst. of Nucl. Technol., Xi-an, China
Volume
43
Issue
5
fYear
2015
fDate
May-15
Firstpage
1670
Lastpage
1674
Abstract
This paper deals with the theory of plasma development in the nanosecond high-power microwave breakdown at the dielectric/air interface. Utilizing the Poisson and Boltzmann equations, the basic physics are explored and investigated. Corresponding to the incident electric field, electrons moving back and forth bring about the negative charge accumulation at the interface. This process generates an extra electric field, strengthening the total amplitude. Simultaneously, deviations of electrons and ions lead to a sheath region providing a space charge field. Secondary electrons are strongly accelerated in the sheath region, eventually leading to an ionization avalanche in a very short time. Both the densities and energies of particles reach the maximums near the sheath region, and that is why the illumination is most significant near the interface. The theory is in good accordance with an experiment conducted under the same conditions.
Keywords
Boltzmann equation; Poisson equation; electric breakdown; high-frequency discharges; plasma sheaths; plasma sources; plasma transport processes; space charge; Boltzmann equation; Poisson equation; dielectric window atmosphere side; dielectric-air interface; electron motion; illumination; incident electric field; interface negative charge accumulation; nanosecond high power microwave breakdown; plasma development; secondary electrons; sheath region; space charge field; Dielectrics; Discharges (electric); Ionization; Microwave theory and techniques; Plasmas; Dielectric window; high-power micro-wave (HPM); high-power microwave (HPM); plasma; plasma.;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2015.2419739
Filename
7089290
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