• DocumentCode
    3394817
  • Title

    The R. A. Evans - P. K. McElroy Award for the 2007 Best Paper

  • Author

    Lange, Clifford H. ; Flint, Ayako

  • Author_Institution
    Novellus Systems Inc., USA
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Abstract
    In the design of fatigue sensitive components, attention is often focused on defining a representative load spectrum that can be used with the fatigue properties of the material to assess the relative merits of a particular design. In practice, these techniques often employ conservative assumptions on the loads and large safety factors on the fatigue properties (e.g. S-N curve) in order to achieve successful performance over a design lifetime. While such approaches are usually sufficient there are many examples where successful design against fatigue failure has proven to be a challenging and costly endeavor. In these cases the fatigue problem is complicated by variability in the underlying load environment, the stress response, or shortcomings with the computational techniques employed for fatigue. Successful design against fatigue failure can only be achieved by considering all of these contributions to the fatigue problem and properly modeling the uncertainty in their definition. In this paper a generalized fatigue formulation is presented that includes the effects of the load environment, the stress response given the load environment, and a fatigue failure criterion. Structural reliability techniques are used to determine the relative impact that each underlying variable has on fatigue life and to compute the failure probability. With this information the designer is more informed about critical deficiencies in his design and can take the necessary steps to address them. Proper use of the proposed methodology is demonstrated with suitable examples.
  • Keywords
    Awards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925751
  • Filename
    4925751