DocumentCode :
3395061
Title :
Exploring VXIbus systems and instrumentation
Author :
Chipperfield, Keith
Author_Institution :
Tektronix Inc., Vancouver, WA, USA
fYear :
1989
fDate :
25-28 Sep 1989
Firstpage :
217
Lastpage :
224
Abstract :
The author attempts to increase the awareness of the advanced triggering features offered by VXI and to introduce some new system configurations to potential users. These configurations offer higher performance for repeatability of test, timing accuracy, and system throughput. A discussion of extended start/stop protocol and SYNC100 triggering illustrates how tight timing synchronization between instrument modules results in a high degree of measurement repeatability. In addition, it is noted that dramatic improvements in throughput can be achieved utilizing hardware sequencing where VXI system resources are used to minimize time-consuming intervention by the system controller. A test system comprising a digitizer, an arbitrary waveform generator, and a scanner is discussed, with emphasis on the implementation of extended start/stop protocol and hardware sequencing to potential system applications. Attention is given to the instrument features differentiating these products from their rack and stack counterparts
Keywords :
automatic test equipment; computer interfaces; protocols; ATE; SYNC100 triggering; VXIbus; arbitrary waveform generator; digitizer; extended start/stop protocol; modules; repeatability of test; scanner; system throughput; timing accuracy; triggering; Control systems; Hardware; Instruments; Materials testing; Protocols; Synchronization; System performance; System testing; Throughput; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
Type :
conf
DOI :
10.1109/AUTEST.1989.81124
Filename :
81124
Link To Document :
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