• DocumentCode
    3395429
  • Title

    Analysis of the performance of safety-critical systems with diagnosis and periodic inspection

  • Author

    Zhang, Tieling ; Wang, Yiming ; Xie, Min

  • Author_Institution
    Hitachi Global Storage Technol., Singapore Pte Ltd., Singapore
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    143
  • Lastpage
    148
  • Abstract
    This paper presents a method for analysis of performance indexes of safety-critical systems. It incorporates periodic inspection and repair which occurs just after each time interval into Markov model. This modeling technique is applied to the typical system structures regulated in the standard IEC 61508. Both perfect and imperfect inspections and repairs can be modeled. Through derivation, a variety of important system performance indexes can be obtained in closed form, that include MTTF, MTTFD, MTTFS, average availability, average probability of failure-dangerous, and average probability of failure on demand. The solutions are applied to 1-out-of-2 system structure to illustrate the usefulness of this method in analyzing the system performance, for example, choice of proof-test interval and evaluation on the average probability of failure on demand.
  • Keywords
    IEC standards; Markov processes; inspection; maintenance engineering; probability; safety systems; IEC 61508 standard; Markov model; performance index analysis; periodic inspection; probability; repair; safety-critical systems; Availability; Degradation; Failure analysis; Humans; IEC standards; Inspection; Performance analysis; Safety; System performance; Systems engineering and theory; Availability; MTTF; Markov model; failure on demand; periodic inspection; safety-critical system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925785
  • Filename
    4925785