• DocumentCode
    3395517
  • Title

    Optimizing the number of failure modes for design analysis based on physics of failure

  • Author

    Loll, Valter

  • Author_Institution
    Nokia Mobile Phones R&D
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    166
  • Lastpage
    170
  • Abstract
    Design for reliability requires a different approach from failure reporting and corrective action system (FRACAS) and test, analyze and fix (TAAF) both of which are tools for reliability improvement of already designed hardware. The physics of failure analysis approach should be used focusing on each failure mode separately. Through a step by step design analysis and test process, the number of potential failure modes should be reduced. As many failure modes as possible should be mitigated by appropriate design changes and the remaining failure modes should be controlled through adequate design stress vs. strength margins. The failure modes with insufficient margins (meaning high likelihood of occurrence in the time of interest) should be extensively analyzed and tested to ensure that they do not contribute to an unacceptable number of failures in the field. The use of this method requires that the equipment manufacturer also actively collect and list failure modes for previous products as well as for components, materials and processes.
  • Keywords
    design engineering; failure analysis; reliability theory; FRACAS; design analysis; equipment manufacturer; failure analysis; failure modes; failure-reporting-and-corrective-action-system; physics-of-failure; reliability improvement; test process; test-analyze-and-fix; Costs; Design optimization; Failure analysis; Life estimation; Physics; Qualifications; Robustness; Stress control; Subcontracting; System testing; HALT; accelerated testing; design for reliability; failure modes; physics of failure; robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925789
  • Filename
    4925789