Title :
Astonishing suppression of oxyfluorination and significant influence of fluorination on charge injection to linear low density polyethylene
Author :
Xie, Chen ; An, Zhenlian ; Jiang, Vue ; Zheng, Feihu ; Zhang, Yewen
Author_Institution :
Pohl Inst. of Solid State Phys., Tongji Univ., Shanghai, China
Abstract :
Surface fluorination and oxyfluorination were performed for LLDPE to suppress the charge injection under HVDC. The astonishing suppression effects are obtained especially by the oxyfluorination and also by the industrial fluorination, as observed by the measurements of space charge profile based on the PWP method. However, considerably different cases of space charge profile are seen between the laboratory fluorinations and the industrial fluorination or between the laboratory fluorinations. The effectiveness of chemical modification by the fluorinations or oxyfluorination was inspected by ATR-IR analysis, and mechanisms of the astonishing suppression effects or the significant influences on charge injection are investigated by the measurements of TSD current and surface energy in views of charge traps and permittivity in surface layer, and the diffusion of volatile small molecules in the semicon electrode to LLDPE.
Keywords :
charge measurement; polyethylene insulation; power cable insulation; space charge; ATR-IR analysis; HVDC polymeric cables; LLDPE; charge traps; chemical modification; industrial fluorination; oxyfluorination astonishing suppression; permittivity; space charge profile measurement; surface energy; Aerospace industry; Charge measurement; Chemical analysis; Current measurement; Energy measurement; HVDC transmission; Laboratories; Permittivity measurement; Polyethylene; Space charge; Charge trap; Linear low density polyethylene; Space charge accumulation; Surface fluorination; surface energy;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252240