Title :
Study on the trap distribution in polyimide thin film based on TSDC method
Author :
Yang Chun ; Zhang Ying ; He Lijuan ; Xue Yucui ; Tian Fuqiang ; Jiang Xiuchen ; Lei Qingquan
Author_Institution :
Sch. of Electron., Inf. & Electr. Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Electron traps in polyimide (PI) film were investigated by analyses of thermally stimulated depolarization current (TSDC). A broad a peak of TDSC was observed around 459K in PI which was ascribed to the release of space charge. Then we estimated electron tr ap levels in polyimide based on the theory of Simmons and found their distributed by Gaussian distribution in the range of 0.45~0.90eV. And compare the trap distributions of PI-SiO2 and PI-Al2O3 nano-composite films, give a picture of nano-particle effected on the properties of polymeric dielectric.
Keywords :
Gaussian distribution; dielectric thin films; electron traps; nanocomposites; polymer films; space charge; thermally stimulated currents; Gaussian distribution; TSDC method; electron trap levels; nanocomposite films; polyimide thin film; polymeric dielectric; space charge; thermally stimulated depolarization current; trap distribution; Polyimides; Transistors; Dielectric; Nano-composite; Polymeric thin film; Trap distribution;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252244
