On-wafer radiation pattern measurements of integrated antennas on standard BiCMOS and glass processes for 40-80GHz applications

Author

Segura, Noel ; Montusclat, Sebastien ; Person, Christian ; Tedjini, Smail ; Gloria, Daniel

Author_Institution

Q-TPS Lab., STMicroelectronics, Crolles, France

fYear

2005

fDate

4-7 April 2005

Firstpage

107

Lastpage

111

Abstract

Integrated antenna on-wafer measurements, achieved on standard STMicroelectronics BiCMOS and glass processes, are presented for applications between 40 GHz and 80 GHz. Radiation pattern and S-parameter measurements of a dipole and a patch antenna are described. For the first time, measurements of integrated millimeterwave antennas are shown at these frequencies. A complete test bench has been realized. In addition, associated wideband high frequency dipole modeling is described.

Keywords

BiCMOS integrated circuits; S-parameters; antenna radiation patterns; antenna testing; dipole antennas; microstrip antennas; millimetre wave antennas; 40 to 80 GHz; BiCMOS; CPS dipole dipole antenna; S-parameter measurements; glass processes; integrated antennas; integrated millimeterwave antennas; on-wafer radiation pattern measurements; patch antenna; test bench; wideband high frequency dipole modeling; Antenna measurements; Antenna radiation patterns; BiCMOS integrated circuits; Dipole antennas; Frequency measurement; Glass; Measurement standards; Patch antennas; Scattering parameters; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on

Print_ISBN

0-7803-8855-0

Type

conf

DOI

10.1109/ICMTS.2005.1452238

Filename

1452238