Title :
Simulation of worst case switching noise on a DDR2 interface
Author :
Mandrekar, R. ; Harvey, P.M. ; Kuruts, J. ; Dreps, Daniel ; Ozguner, T. ; Yaping Zhou
Author_Institution :
Kazushige Kawasaki, IBM Corp., Austin, TX
Abstract :
This paper describes a new technique to simulate worst case simultaneous switching noise on a DDR2 interface. The paper focuses on how the impedance response of the power distribution network can be used in determining an excitation pattern that results in the worst case switching noise on the interface.
Keywords :
distribution networks; electric impedance; integrated memory circuits; noise; DDR2 interface; excitation pattern; impedance response; power distribution network; switching noise; Circuit simulation; Driver circuits; Impedance; Noise generators; Noise level; Power systems; Rails; Resonance; Resonant frequency; Switches;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
DOI :
10.1109/EPEP.2008.4675884
