• DocumentCode
    3396241
  • Title

    Fault propagation analysis for complex system based on small-world network model

  • Author

    Gao, Jianmin ; Li, Guo ; Zhiyong Gao

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Univ. of Xi´´an Jiaotong, Xian
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    359
  • Lastpage
    364
  • Abstract
    The spreading of faults and serious failures in many large-scale engineering systems is today one of the issues of the highest concern. This paper presents a novel method for modeling the fault propagation behaviors from the perspective of complex network theory. By focusing essentially on the topological structure properties of the underlying system network, several principles that are capable of assessing the safety characteristics of the network nodes are proposed. Rather than the probabilistic approach, the fault propagation intensity considering the network statistical information is defined as the weight of the link between the nodes. Subsequently, the critical nodes and the fault propagation paths with high risk are obtained through the qualitative fault propagation analysis. A case study of sym-tetramethyl benzene (STBZ) production system is provided to illustrate the feasibility of the proposed approach, and to verify the efficiency to discover the system vulnerability. Research shows that the safety performance of a complex system is indeed affected by the availability of some critical nodes, which is a helpful method to the safety assessment and failure prevention.
  • Keywords
    failure analysis; fault diagnosis; fault trees; complex network theory; complex system; failure prevention; fault propagation analysis; fault propagation paths; largescale engineering systems; safety assessment; small-world network model; sym tetramethyl benzene production system; system vulnerability; Availability; Complex networks; Electric breakdown; Failure analysis; Large scale integration; Production systems; Risk analysis; Safety devices; Systems engineering and theory; Virtual manufacturing; Critical nodes; Fault propagation; Safety analysis; Small-world network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925822
  • Filename
    4925822