DocumentCode
3396457
Title
Parameter estimation for a repairable system under imperfect maintenance
Author
Yu, Pingjian ; Song, Joon Jin ; Cassady, C. Richard
Author_Institution
Dept. of Ind. Eng., Univ. of Arkansas, Fayetteville, AR
fYear
2008
fDate
28-31 Jan. 2008
Firstpage
428
Lastpage
433
Abstract
Estimation of reliability and maintainability parameters is essential in modeling repairable systems and determining maintenance policies. However, because of the aging of repairable systems under imperfect maintenance, failure times are neither identically nor independently distributed, which makes parameter estimation difficult. In this paper, we apply Bayesian methods for estimation of reliability and maintainability parameters based on historical reliability and maintainability (RAM) data. We assume the first failure of the repairable system follows a Weibull probability distribution. The repairable system experiences Kijima Type I imperfect corrective maintenance and Kijima Type I imperfect preventive maintenance. Using a Bayesian perspective, we estimate four parameters for this repairable system: the shape parameter of the Weibull probability distribution (beta), the scale parameter of the Weibull distribution (eta), the imperfect maintenance factor for corrective maintenance (alphar) and the imperfect maintenance factor for preventive maintenance (alphap). The proposed method is illustrated with simulated RAM data.
Keywords
Bayes methods; Weibull distribution; preventive maintenance; reliability; Bayesian method; Kijima Type I imperfect corrective maintenance; Kijima Type I imperfect preventive maintenance; Weibull probability distribution; maintainability parameter estimation; maintenance policy; reliability; repairable system; Aging; Bayesian methods; Defense industry; Maximum likelihood estimation; Optimization methods; Parameter estimation; Preventive maintenance; Probability distribution; Shape; Weibull distribution; Bayesian Analysis; Imperfect Maintenance; Parameter Estimation; Reliability and Maintainability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
Conference_Location
Las Vegas, NV
ISSN
0149-144X
Print_ISBN
978-1-4244-1460-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2008.4925834
Filename
4925834
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