DocumentCode :
3396476
Title :
An analysis on measurement sensitivity of Short-Pulse Propagation technique using a virtual test bench
Author :
Zhou, Zhen ; Deutsch, Alina ; Melde, Kathleen L. ; Katopis, George A. ; Morsey, Jason D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ
fYear :
2008
fDate :
27-29 Oct. 2008
Firstpage :
213
Lastpage :
216
Abstract :
This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the short-pulse propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and de-embedding steps of frequency-domain characterization.
Keywords :
frequency-domain analysis; virtual instrumentation; frequency-domain characterization; line parameter tolerances; measurement sensitivity analysis; production level circuit boards; short-pulse propagation technique; virtual test bench; Circuit simulation; Circuit testing; Electric variables measurement; Electronic equipment testing; Fabrication; Hardware; Printed circuits; Production; Stripline; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
Type :
conf
DOI :
10.1109/EPEP.2008.4675917
Filename :
4675917
Link To Document :
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