Title :
Thermal modeling of on-chip interconnects and 3D packaging using EM tools
Author :
Jiang, Lijun ; Kolluri, Seshadri ; Rubin, Barry J. ; Smith, Howard ; Colgan, Evan G. ; Scheuermann, Michael R. ; Wakil, J.A. ; Deutsch, Alina ; Gill, Jason
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
Abstract :
The green (low power) chip design demands dramatic thermal and electrical simulation capabilities. In this paper, a novel thermal simulation approach for automatic thermal modeling of very large problems is introduced. This methodology can be fully integrated with existing solvers for electrical simulations, and make it possible to analyze practical on-chip and packaging thermal problems using the existing electromagnetic tools and geometry definitions, with very small additional effort. Its various applications to BEOL (on-chip wiring), thermal guideline design, and 3D integration (for multiple chip stacks) thermal modeling are investigated in this paper. We will demonstrate this capability with an automatic modeling framework, ChipJoule, for representative cases.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit packaging; low-power electronics; thermal management (packaging); 3D packaging; ChipJoule; automatic thermal modeling; electrical simulation; electromagnetic tools; on-chip interconnects; thermal guideline design; thermal simulation; Analytical models; Dielectrics; Electric resistance; Electromagnetic analysis; Integrated circuit interconnections; Packaging; Resistance heating; Temperature distribution; Thermal conductivity; Thermal resistance;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
DOI :
10.1109/EPEP.2008.4675934