Title :
Capacitive Impedance Spectroscopy measuring system
Author :
Xi, Zhaohui ; Stoynov, Z. ; Vladikova, D. ; Nuncho, Nunev
Author_Institution :
Coll. of Meas. Control Tech & Commun. Eng., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
During the last years the method of the Electrochemical Impedance Spectroscopy has been intensively developed. It is the most powerful electrochemical method, because of it unique ability to investigate the structure and the properties of the objects in a wide frequency range. The Capacitive Impedance Spectroscopy (CIS) is of special interest. The further development of this principle is given in the current work. It gives an opportunity to investigate the electric properties of different kinds of materials. A special measuring system is developed for this purpose. A modern computer techniques with a special data analyze software is also described.
Keywords :
electrochemical impedance spectroscopy; permittivity; capacitive impedance spectroscopy measuring system; data analyze software; electric properties; electrochemical method; Application software; Computational Intelligence Society; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Electrodes; Electromagnetic wave polarization; Impedance measurement; Permittivity measurement; capacitive impedance spectroscopy; complex electric permittivity; electrochemical impedance spectroscopy;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252302
