Title :
Enhancement of the acquisition speed of somatosensory evoked potentials by a response tuned wavelet filter
Author :
Journe, H.L. ; Der Worp, P. E van ; Zeinstra, E. ; Buchthal, A. ; Mooij, J.J.A.
Author_Institution :
Dept. of Neurological Surg. & Anesthesiology, Univ. Hosp. Groningen, Netherlands
Abstract :
A pilot study was performed to see how much a Wavelet Transform (WT) based filter can reduce the recording time of intra-operative monitored somatosensory evoked potentials (SSEP) from contralateral median nerve stimulation. The designed filtering technique used a coefficient mask that was obtained from a WT of a completed SSEP response (n=500) that was overlaid on the time-scale coefficients of responses of individual subsums (n=25) before the signals underwent back transformation. The efficacy of the WT-filter was judged numerically by comparing the number of coefficients from the subsums with the number of coefficients of a completed response (threshold: 0.05 of the largest coefficient). Different Daubechies orthonormal wavelets (D4-D20) were examined. The completed SSEP response could be recognised in many of the WT-filtered subsums plots. The best results are obtained from wavelets between D12-D20. The reduction of the number of coefficients by the WT filter varied between 1/3 to 1/9 which predicts a reduction of the recording time by 30 to 70 percent, compared to conventional averaging
Keywords :
bioelectric potentials; filters; medical signal processing; patient monitoring; somatosensory phenomena; surgery; wavelet transforms; Daubechies orthonormal wavelets; acquisition speed enhancement; coefficient mask; contralateral median nerve stimulation; electrodiagnostics; intraoperative monitoring; recording time reduction; response tuned wavelet filter; somatosensory evoked potentials; time-scale coefficients; Event detection; Filtering; Filters; Frequency; Hospitals; Monitoring; Signal design; Surgery; Tin; Wavelet transforms;
Conference_Titel :
Engineering in Medicine and Biology Society, 1995., IEEE 17th Annual Conference
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-2475-7
DOI :
10.1109/IEMBS.1995.579486