Title :
TPS evolution and test software development in the two-level maintenance environment
Author_Institution :
JKS Syst. Ltd., Westlake Village, CA, USA
Abstract :
Two-level maintenance and BIT/software intensive line replaceable module architectures will be driven by the dual imperatives of harmonizing online UUT BIT/BIST (unit under test built-in test/built-in self-test) with offline ATS/TPS (automatic test system/test program set) test capability and of improving the approach to software specification and development in both areas. It is suggested that these imperatives can be satisfied through the introduction of a consolidated support package (CSP) concept that is derived from, but replaces, the currently used TPS. The CSP, which can be used as a key element in the acquisition of demonstrable integrated support capability, is an identifiable entity developed in accordance with a generic standard such as DOD-STD-2167A, but tailored by maintenance-specific standards to test software needs
Keywords :
automatic test equipment; maintenance engineering; military computing; military systems; programming environments; software engineering; standards; DOD-STD-2167A; UUT BIT/BIST; automatic test system/test program set; consolidated support package; maintenance-specific standards; software specification; test software development; two-level maintenance environment; Automatic testing; Built-in self-test; Chip scale packaging; Embedded software; Programming; Software maintenance; Software standards; Software testing; Standards development; System testing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81138