Author index

fYear

2005

fDate

4-7 April 2005

Firstpage

263

Lastpage

267

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on

Conference_Location

Leuven

Print_ISBN

0-7803-8855-0

Type

conf

DOI

10.1109/ICMTS.2005.1452285

Filename

1452285

Link To Document