DocumentCode
33971
Title
Exploiting Hetero-Junctions to Improve the Performance of III–V Nanowire Tunnel-FETs
Author
Pala, Marco G. ; Brocard, Sylvan
Author_Institution
Centre Nat. de la Rech. Sci., Inst. de Microelectron. Electromagn. et Photonique et le Lab. d´ Hyperfreq. et de Caracterisation, Grenoble, France
Volume
3
Issue
3
fYear
2015
fDate
May-15
Firstpage
115
Lastpage
121
Abstract
This paper presents full-quantum 3-D simulations predicting the electrical performance of nanowire tunnel-FETs based on III-V hetero-junctions. Our calculations exploit an eight-band k·p Hamiltonian within the nonequilibrium Green´s functions formalism and include phonon scattering. It is shown that the on-current of GaSb/InAs hetero-junction tunnel-FETs is limited by quantum confinement effects on the bandstructure induced by the small nanowire diameter necessary to preserve an optimal electrostatic integrity at short gate lengths. To circumvent this problem, additional on-current improvements with no substantial subthreshold swing degradation can be achieved by engineering the source region through the insertion of an InAs/GaSb/InAs quantum well along the transport direction. Such a design option is predicted to provide on/off-current ratios larger than 107 even at VDD = 300 mV.
Keywords
Green´s function methods; III-V semiconductors; electrostatics; field effect transistors; gallium compounds; indium compounds; nanowires; tunnel transistors; GaSb-InAs; III-V heterojunction nanowire tunnel-FET; eight-band k·p Hamiltonian; electrostatic integrity; full-quantum 3D simulation; nonequilibrium Green function; phonon scattering; quantum confinement effect; quantum well; short gate length; substantial subthreshold swing degradation; voltage 300 mV; IEEE Electron Devices Society; Logic gates; MOSFET; Nanoscale devices; Photonic band gap; Tunneling; III-V semiconductors; field effect transistors; non-equilibrium green???s functions; numerical simulation; quantum transport; semiconductor heterojunctions; tunnel-FET; tunneling;
fLanguage
English
Journal_Title
Electron Devices Society, IEEE Journal of the
Publisher
ieee
ISSN
2168-6734
Type
jour
DOI
10.1109/JEDS.2015.2395719
Filename
7018893
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