• DocumentCode
    33971
  • Title

    Exploiting Hetero-Junctions to Improve the Performance of III–V Nanowire Tunnel-FETs

  • Author

    Pala, Marco G. ; Brocard, Sylvan

  • Author_Institution
    Centre Nat. de la Rech. Sci., Inst. de Microelectron. Electromagn. et Photonique et le Lab. d´ Hyperfreq. et de Caracterisation, Grenoble, France
  • Volume
    3
  • Issue
    3
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    115
  • Lastpage
    121
  • Abstract
    This paper presents full-quantum 3-D simulations predicting the electrical performance of nanowire tunnel-FETs based on III-V hetero-junctions. Our calculations exploit an eight-band k·p Hamiltonian within the nonequilibrium Green´s functions formalism and include phonon scattering. It is shown that the on-current of GaSb/InAs hetero-junction tunnel-FETs is limited by quantum confinement effects on the bandstructure induced by the small nanowire diameter necessary to preserve an optimal electrostatic integrity at short gate lengths. To circumvent this problem, additional on-current improvements with no substantial subthreshold swing degradation can be achieved by engineering the source region through the insertion of an InAs/GaSb/InAs quantum well along the transport direction. Such a design option is predicted to provide on/off-current ratios larger than 107 even at VDD = 300 mV.
  • Keywords
    Green´s function methods; III-V semiconductors; electrostatics; field effect transistors; gallium compounds; indium compounds; nanowires; tunnel transistors; GaSb-InAs; III-V heterojunction nanowire tunnel-FET; eight-band k·p Hamiltonian; electrostatic integrity; full-quantum 3D simulation; nonequilibrium Green function; phonon scattering; quantum confinement effect; quantum well; short gate length; substantial subthreshold swing degradation; voltage 300 mV; IEEE Electron Devices Society; Logic gates; MOSFET; Nanoscale devices; Photonic band gap; Tunneling; III-V semiconductors; field effect transistors; non-equilibrium green???s functions; numerical simulation; quantum transport; semiconductor heterojunctions; tunnel-FET; tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2015.2395719
  • Filename
    7018893