Similarity between treeing lifetime and PD resistance in aging mechanisms for epoxy nanocomposites

Author

Tanaka, Toshikatsu

Author_Institution

IPS Res. Center, Waseda Univ., Kitakyushu, Japan

fYear

2009

fDate

19-23 July 2009

Firstpage

741

Lastpage

744

Abstract

PD (partial discharge) resistance is prominent in polymer nanocomposites, which is enhanced by nano- segmentation of matrices, tight coupling in interfaces, and pile-up of nano fillers on surfaces. Treeing resistance is determined by partial dielectric breakdown of solids to produce initial trees followed by widening and extending hollow channels due to internal PDs. Therefore, treeing turns out to be related to PD resistance, when PDs are predominant in treeing breakdown. Such phenomena were actually observed in epoxy nanocomposites. Similar aging processes are considered to be underlying in both treeing lifetime and PD resistance. Such similarity is discussed and substantiated by SEM images of tree channels.

Keywords

ageing; epoxy insulation; nanocomposites; partial discharges; scanning electron microscopy; trees (electrical); PD resistance; SEM images; aging mechanisms; epoxy nanocomposites; nanofillers; nanosegmentation; partial dielectric breakdown; partial discharge resistance; polymer nanocomposites; treeing lifetime; treeing resistance; Aging; Degradation; Dielectric breakdown; Dielectric materials; Electric resistance; Mechanical factors; Nanocomposites; Partial discharges; Polymers; Surface resistance; coupling agents; interfaces; nanocomposites; partial discharge; polymer nanocomposites; treeing;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the

Conference_Location

Harbin

Print_ISBN

978-1-4244-4367-3

Electronic_ISBN

978-1-4244-4368-0

Type

conf

DOI

10.1109/ICPADM.2009.5252322

Filename

5252322