Title :
Similarity between treeing lifetime and PD resistance in aging mechanisms for epoxy nanocomposites
Author :
Tanaka, Toshikatsu
Author_Institution :
IPS Res. Center, Waseda Univ., Kitakyushu, Japan
Abstract :
PD (partial discharge) resistance is prominent in polymer nanocomposites, which is enhanced by nano- segmentation of matrices, tight coupling in interfaces, and pile-up of nano fillers on surfaces. Treeing resistance is determined by partial dielectric breakdown of solids to produce initial trees followed by widening and extending hollow channels due to internal PDs. Therefore, treeing turns out to be related to PD resistance, when PDs are predominant in treeing breakdown. Such phenomena were actually observed in epoxy nanocomposites. Similar aging processes are considered to be underlying in both treeing lifetime and PD resistance. Such similarity is discussed and substantiated by SEM images of tree channels.
Keywords :
ageing; epoxy insulation; nanocomposites; partial discharges; scanning electron microscopy; trees (electrical); PD resistance; SEM images; aging mechanisms; epoxy nanocomposites; nanofillers; nanosegmentation; partial dielectric breakdown; partial discharge resistance; polymer nanocomposites; treeing lifetime; treeing resistance; Aging; Degradation; Dielectric breakdown; Dielectric materials; Electric resistance; Mechanical factors; Nanocomposites; Partial discharges; Polymers; Surface resistance; coupling agents; interfaces; nanocomposites; partial discharge; polymer nanocomposites; treeing;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252322
