Title :
Simulation on SF6 gas discharge by PIC-MCC method
Author :
Li, Jing ; Cao, Yundong ; Liu, Xiaoming ; Zou, Jiyan ; Hou, Chunguang
Author_Institution :
Sch. of Electr. Eng., Shenyang Univ. of Technol., Shenyang, China
Abstract :
Sulfur hexafluoride is a gas with high electronegativity. For its strong adsorption to the electrons, it is widely used in the gas insulation. A microscopic model is established in our work to study the motions of particles in sulfur hexafluoride gas. Particle in cell method is used to trace the motions of the charged particles and the collisions between electrons, ions and atoms are simulated by a random method - Monte Carlo collision method. A plane electrodes system is modeled in our work and the distance between the electrodes is 25.4 mm and the voltage between the electrodes is 12 kV. The temperature of the gas is 293 K. We traced the motions of a large amount of the electrons and assembled average which made us acquire the macroscopic distributions. Nine types of collisions between electron and molecule are considered in our work and the elastic collision and charge exchange between ions and atoms are also considered. According to the simulation, the densities of different particles and the electric field solved by Possion equation are acquired.
Keywords :
Monte Carlo methods; SF6 insulation; atom-ion collisions; charge exchange; discharges (electric); electrodes; electron collisions; electronegativity; plasma collision processes; random processes; sulphur compounds; Monte Carlo collision method; PIC-MCC method; Possion equation; SF6; elastic collision; electron adsorption; gas discharge simulation; gas insulation; high electronegativity; macroscopic distribution; microscopic model; particle-in-cell method; plane electrodes system; random method; simulation; temperature 293 K; voltage 12 kV; Assembly; Differential equations; Electrodes; Electrons; Gas insulation; Microscopy; Monte Carlo methods; Sulfur hexafluoride; Temperature distribution; Voltage; SF6 discharge; numerical modeling; particle collisions; particle-in-cell/Monte Carlo Collision;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252327