DocumentCode :
3397344
Title :
Effect of different dopant in machinable ceramic on its surface flashover characteristics in vacuum
Author :
Yu, Kaikun ; Zheng, Nan ; Tian, Jie ; Liu, Guoqing ; Zhang, Guanjun
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xian Jiaotong Univ., Xi´´an, China
fYear :
2009
fDate :
19-23 July 2009
Firstpage :
717
Lastpage :
720
Abstract :
As well known, the secondary electron emission yield is one important factor for the flashover phenomena of solid materials under high electric field in vacuum. On the basis of the novel low melting temperature machinable glass ceramics for vacuum insulation system, which has excellent machinable performance and good electrical properties, different low SEE yield metal oxides including Cu2O and Cr2O3 were doped into the original glass ceramics to investigate the effects of different process technology on the surface flashover phenomena of the machinable ceramics under pulse voltage in vacuum. We found that after doping the metal oxide, the samples´ surface flashover voltage has changed. Experimental results revealed that after doping metal oxide into the machinable ceramic, the sample´s SEE yield relatively reduced.
Keywords :
aluminosilicate glasses; borosilicate glasses; chromium compounds; copper compounds; doping; flashover; fluorine; glass ceramics; insulating materials; magnesium compounds; secondary electron emission; zinc compounds; SiO2-B2O3-Al2O3-ZnO-MgO-F-Cu2O-Cr2O3; doping; electrical properties; glass ceramics; machinable ceramic; secondary electron emission; surface flashover; Ceramics; Doping; Electron emission; Flashover; Glass; Solids; Temperature; Vacuum systems; Vacuum technology; Voltage; SEE yield; flashover; machinable ceramic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
Type :
conf
DOI :
10.1109/ICPADM.2009.5252328
Filename :
5252328
Link To Document :
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