Title :
Parametric yield optimization of electronic circuits via improved centers of gravity algorithm
Author :
Kermat, M. ; Kielbasa, Richard
Author_Institution :
Service des Mesures, Ecole Superieure d´´Electr., Gif-sur-Yvette, France
Abstract :
An improved centers of gravity (CG) algorithm is presented for circuit yield optimization or for the well-known design centering (DC) problem. The CG algorithm is based on the estimation of circuit yield and CG of pass and fail sampled points. A new type of estimator and the Latin hypercube sampling (LHS) scheme are proposed in order to improve the estimation accuracy with the same computational time. Simulation results have shown a good agreement with the theoretical basis.
Keywords :
circuit optimisation; hypercube networks; integrated circuit yield; iterative methods; Latin hypercube sampling; centers of gravity algorithm; circuit yield optimization; computational time; estimation accuracy; parametric yield optimization; sampled points; Algorithm design and analysis; Character generation; Circuit simulation; Computational modeling; Design optimization; Electronic circuits; Gravity; Hypercubes; Sampling methods; Yield estimation;
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Print_ISBN :
0-7803-3694-1
DOI :
10.1109/MWSCAS.1997.662348
