• DocumentCode
    3397530
  • Title

    Staffing analysis tool for operator-machine-lot interference in semiconductor manufacturing

  • Author

    Meyersdorf, Doron ; Biron, Ori ; Ozelkan, Ertunga C. ; Fowler, John W.

  • Author_Institution
    Ind. Eng. & Syst. Anal. Ltd., Foster City, CA, USA
  • fYear
    1997
  • fDate
    10-12 Sep 1997
  • Firstpage
    335
  • Lastpage
    340
  • Abstract
    This paper describes the concepts underlying a new staffing tool, which evaluates staffing requirements, plan future shift sizes, perform sensitivity analysis, and locate and measure improvement opportunities in terms of worker operations. The model is based on M/M/S/K queuing theory to analyze the operator-machine-lot (OML) interference especially in semiconductor manufacturing processes. Unlike classical approaches, in which the machines are treated as customers, here wafer lots are taken as the designated customers to be serviced. A comparison of a simulation, OML, and a traditional M/M/S/K model (where the machines are modeled as customers) shows that OML model yields much closer results to the simulation than the traditional M/M/S/K model. Furthermore, from the computational point of view OML is more efficient than the simulation model which can be very time consuming especially in the complex semiconductor manufacturing environment. Thus, OML model is a superior alternative to the classical interference modeling and facilitates staffing recommendations that improve overall equipment effectiveness (GEE) and therefore productivity
  • Keywords
    computer aided production planning; human resource management; integrated circuit manufacture; personnel; queueing theory; semiconductor device manufacture; sensitivity analysis; M/M/S/K queuing theory; operator-machine-lot interference; productivity; semiconductor manufacturing; sensitivity analysis; shift size planning; staffing analysis tool; staffing requirements evaluation; wafer lot; worker operations; Computational modeling; Computer aided manufacturing; Interference; Manufacturing processes; Performance evaluation; Queueing analysis; Semiconductor device modeling; Sensitivity analysis; Size measurement; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-4050-7
  • Type

    conf

  • DOI
    10.1109/ASMC.1997.630758
  • Filename
    630758