Title : 
Planning for SOC test with power constraint based on quantum algorithm
         
        
            Author : 
Chuan-Pei, Xu ; Jing, Zhang ; Xue-Yun, Lu
         
        
            Author_Institution : 
Dept. of Electron. Eng., Guilin Univ. of Electron. Technol., Guilin, China
         
        
        
        
        
        
            Abstract : 
Combining with the characteristic of SOC test planning and test power, the optimization for SOC test based on quantum algorithm is introduced in this paper, in the paper, the corresponding mathematical model is established and the design of algorithm is given. After establishing the model with appropriate parameters, the power limit is ascertained, then the optimal individual can be distinguished. During the process of algorithm realization, genetic factors are changed according to a discriminant function, and the shortest test times with power constraints can be find out. Validation of the algorithm is made with ITC´02 SOC test benchmarks finally. Experimental results demonstrate the advantages of quantum algorithm compared with other algorithms.
         
        
            Keywords : 
logic testing; power aware computing; quantum computing; system-on-chip; SOC test planning; SOC test power; discriminant function; genetic factors; quantum algorithm; system-on-chip; Benchmark testing; Heating; Quantum computing; SOC test; power constraints; quantum algorithm;
         
        
        
        
            Conference_Titel : 
Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
         
        
            Conference_Location : 
Guilin
         
        
            Print_ISBN : 
978-1-4244-6834-8
         
        
        
            DOI : 
10.1109/ICISS.2010.5655480