• DocumentCode
    3397769
  • Title

    Mechanical properties of a lead-free solder alloys

  • Author

    Zhu, Fulong ; Wang, Zhiyong ; Guan, Rongfeng ; Zhang, Honghai

  • Author_Institution
    Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci. & Technol., China
  • fYear
    2005
  • fDate
    15-18 March 2005
  • Firstpage
    107
  • Lastpage
    112
  • Abstract
    Lately, environmental problems have gained more and more attention from many countries; because of environmental pollution from lead-based solders and compounds, many countries are about to prohibit the using of lead-based solders in microelectronic packaging; lead-free solder alloys will replace tin-lead (Sn-Pb) eutectic solders. However, the mechanical properties of lead-free solders have not been clarified The tensile property of Sn96.5Ag3Cu0.5 was investigated. The tensile strength of this lead-free solder was obtained at 25°C, 50°C, 75°C, 100°C, 125°C and 150°C; the tensile strength of the lead-free solder decreases with increasing test temperature at a constant strain rate. The tensile strengths of a lead-free and a lead-based solder were compared, and the tensile strength of Sn96.5Ag3Cu0.5 was found to be close to that of Sn63Pb37; this lead-free solder has some good mechanical properties, and will be a promising candidate solder alloy in microelectronic packaging.
  • Keywords
    copper alloys; electronics packaging; eutectic alloys; lead alloys; silver alloys; solders; stress-strain relations; tensile strength; tin alloys; 25 to 150 C; SnAgCu; SnPb; constant strain rate; lead-based solders; lead-free solder alloys; mechanical properties; microelectronic packaging; stress-strain curves; tensile strength; tin-lead eutectic solders; tin-silver-copper alloys; Environmental factors; Environmentally friendly manufacturing techniques; Lead compounds; Mechanical factors; Microelectronics; Packaging; Pollution; Temperature; Tensile strain; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Green Electronics, 2005. AGEC. Proceedings of 2005 International Conference on
  • Print_ISBN
    0-7803-8806-2
  • Type

    conf

  • DOI
    10.1109/AGEC.2005.1452326
  • Filename
    1452326