• DocumentCode
    3397942
  • Title

    Fault distribution modeling using stochastic bivariate models for prediction of voltage sag in distribution systems

  • Author

    Khanh, Bach Quoc ; Won, Dong-Jun ; Moon, Seung-Il

  • Author_Institution
    Electr. Power Syst. Dept., Hanoi Univ. of Technol., Hanoi
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents a new method on fault distribution modeling for stochastic prediction study of voltage sags in the distribution system. Two-dimensional stochastic models for fault modeling make it possible to obtain the fault performance for the whole system of interest, which helps obtaining not only sag performance at individual locations but also system sag performance through system indices of voltage sag. By using bivariate normal distribution for fault distribution modeling, the paper estimates the influence of model parameters on system voltage sag performance. The paper also develops the modified SARFIx regarding phase loads that creates better estimation for voltage sag performance for distribution system.
  • Keywords
    distribution networks; fault diagnosis; normal distribution; power supply quality; stochastic processes; bivariate normal distribution; distribution system voltage sag prediction; fault distribution modeling; stochastic bivariate models; stochastic prediction; Computational modeling; Frequency; Mathematical model; Power quality; Power system modeling; Power system simulation; Predictive models; Stochastic processes; Stochastic systems; Voltage fluctuations; bivariate normal distribution; distribution system; fault distribution modeling; phase loads; power quality; stochastic prediction; voltage sag frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1903-6
  • Electronic_ISBN
    978-1-4244-1904-3
  • Type

    conf

  • DOI
    10.1109/TDC.2008.4517161
  • Filename
    4517161