• DocumentCode
    3398025
  • Title

    A standardized instrument programming language based on IEEE STD 488.2

  • Author

    Nemeth-Johannes, Jay

  • Author_Institution
    Hewlett-Packard, Loveland, CO, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    335
  • Lastpage
    339
  • Abstract
    The author describes the features of the Test and Measurement System Language (TMSL) and how they relate to compatibility. TMSL implements a tree-structured command set, rather than a traditional flat instrument language, allowing keywords to be reusable and identifiable in context. Reusable keywords allow for simple and regular mnemonic generation rules. TMSL has also addressed parameters through the use of regular parameter forms, a say-what-you-mean philosophy for discrete switch setting and the minimization of obscure side effects. TMSL addresses the need for horizontally compatible, signal oriented measurements, as well as the traditional programming of the specific instrument-specific hardware. The author also discusses a model of an instrument developed for TMSL and the importance of such a standardized model. He outlines the advantages realized, including the ease of adding capabilities in the future, the ease of learning, the self-documenting features, the opportunities for reuse of instrument firmware including increased reliability of parsers, and the ease of integrating instruments into existing test systems
  • Keywords
    automatic test equipment; automatic testing; high level languages; standards; IEEE STD 488.2; TMSL; Test and Measurement System Language; compatibility; discrete switch setting; mnemonic generation rules; obscure side effects; reusable keywords; standardized instrument programming language; tree-structured command set; Computer languages; Functional programming; Hardware; Instruments; Measurement standards; Microprogramming; Programming profession; Standardization; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81144
  • Filename
    81144