• DocumentCode
    3398128
  • Title

    Instrument interchangeability through software resource descriptions

  • Author

    Sacher, Eric

  • Author_Institution
    Serendipity Syst. Inc., Sedona, AZ, USA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    340
  • Lastpage
    346
  • Abstract
    IEEE Committee P981 has been actively defining a language and methodology for writing RDs (resource descriptions). The author discusses the makeup and role of RDs, the language used for describing them, and their application in a prototype open-architecture ATE (automatic test equipment) system. It is noted that RDs are intended to describe the interfaces, i.e. the external views, of an instrument. RDs only provide information about how an instrument reacts when stimulated by its environment; they simply describe the cause and its associated effect. They are not intended to describe how an instrument works internally. All RDs are written using the same uniform standard notation. This allows the construction of software that can make use of all manufacturer RDs without modification. With the proper inquiry software, RDs can be used for selecting applicable instruments based on specific test requirements. This application automates instrument selection by computerizing the manual catalog search process. Another use of the RD could be to answer specific questions about the specifications for a given instrument without needing to consult the instrument manuals
  • Keywords
    automatic test equipment; software engineering; IEEE Committee P981; automatic test equipment; interfaces; language; modularity; object oriented state model; prototype open-architecture ATE; software resource descriptions; standard notation; Application software; Automatic test equipment; Control systems; Humans; Instruments; Military computing; Object oriented modeling; Protocols; Standardization; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81145
  • Filename
    81145