Two-level maintenance for missile systems

Author

Dallas, Stephen W. ; Jenkins, Joseph C.

Author_Institution

Comput. Syst. Dev. Corp., Chantilly, VA, USA

fYear

1989

fDate

25-28 Sep 1989

Firstpage

347

Lastpage

350

Abstract

The authors describe the preliminary results of a one-year analysis of two-level maintenance initiatives in the US military services and the development of systems supportable by a two-level structure. The analysis focused on the level of performance for existing systems in the area of built-in-test/built-in-test equipment (BIT/BITE) and related technological developments which promise to yield improvements in BIT/BITE to assist in achieving a two-level maintenance concept. The authors summarize the findings regarding BIT/BITE in Army missile systems and provide preliminary recommendations as to what should be done to enhance the feasibility of implementing a two-level maintenance structure

Keywords

automatic test equipment; maintenance engineering; military systems; missiles; ATE; Army; BIT/BITE; US military services; military electronics; missile; of built-in-test/built-in-test equipment; two-level maintenance; Artificial intelligence; Circuit testing; Expert systems; Maintenance; Military computing; Missiles; Paper technology; System testing; Very high speed integrated circuits; Weapons;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

Conference_Location

Philadelphia, PA

Type

conf

DOI

10.1109/AUTEST.1989.81146

Filename

81146