DocumentCode :
3398217
Title :
Design and testing of thyristor valves of TCSC for Kanpur-Ballabhgarh 400kV line
Author :
Lai, Guanyu ; Dutta, Dipak ; Arunachalam, M.
Author_Institution :
Electron. Div., Bharat Heavy Electricals Ltd., Bangalore
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper describes the design and type testing aspects of thyristor valves of thyristor controlled series capacitor (TCSC) scheme for Kanpur-Ballabhgarh 400 kV line. The single circuit AC line from Kanpur to Ballabhgarh in northern part of India is 400 km long and owned by power grid corporation of India limited (PGCIL). This is India´s first indigenous TCSC scheme. It is a joint developmental project by BHEL, a supplier and utility, PGCIL. Thyristor valves are designed to meet the specified operating and fault conditions. The valves are assembled and production tests performed at electronics division, BHEL, Bangalore, India. In- house manufactured 100 mm wafer size thyristors are used in the thyristor valve. Thyristor valve of each phase is housed in a weatherproof enclosure. The valve enclosure is mounted on the 400 kV-insulated platform. The dielectric and operational type tests including optional tests as per IEC-61954 (1999) were performed at central power research institute (CPRI) Bangalore, India.
Keywords :
flexible AC transmission systems; power transmission lines; thyristors; BHEL; Central Power Research Institute; Kanpur-Ballabhgarh line; TCSC scheme; flexible AC transmission lines; power grid corporation of India limited; single circuit AC line; thyristor controlled series capacitor; thyristor testing; voltage 400 kV; weatherproof enclosure; Assembly; Circuit faults; Circuit testing; Electronic equipment testing; Performance evaluation; Power capacitors; Power grids; Production; Thyristors; Valves; FACTS; TCSC; dielectric tests; operational tests; thyristor Valves; type tests; valve design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
Type :
conf
DOI :
10.1109/TDC.2008.4517175
Filename :
4517175
Link To Document :
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