• DocumentCode
    3398390
  • Title

    Size effect of partial discharge in solid void defects

  • Author

    Gao, Wensheng ; Su, Ning ; Yin, Qingduo

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    501
  • Lastpage
    504
  • Abstract
    The void defect in solid insulation can be considered as one of the important defects which will induce partial discharges (PD) and insulation degradation. In this paper, the relations between the cylindrical void size and PD characteristics are presented and summarized particularly. The PD inceptive electrical field (PDIE), the maximal PD magnitude and the impulse waveforms are especially studied with different void defects´ depths and diameters. These PD characteristics, especially for PD impulse waveforms, changed dramatically with the increase of void size, which imply the various ionization states in PD process. The results show that large size voids always induce low PDIE and large maximal PD magnitude, which confirm the certain relations between insulation degradation degree and PD characteristics. Some of the results show that the PD with more residual ions may cause much serious degradation of solid insulations. The floating electrode defect test has been designed as a proving trial lastly.
  • Keywords
    electric strength; insulating materials; ion beam effects; ionisation; partial discharges; voids (solid); cylindrical void size; floating electrode defect test; impulse waveforms; insulation degradation; ionization states; partial discharge inceptive electrical field; partial discharge magnitude; residual ions; size effect; solid insulation; solid void defects; Aging; Circuit testing; Coupling circuits; Degradation; Dielectric materials; Dielectrics and electrical insulation; Electrons; Partial discharges; Solids; Voltage; Partial Discharge; degradation degree; residual ions; size effect; void defects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252380
  • Filename
    5252380