• DocumentCode
    3398454
  • Title

    Automated wafer transport in the wafer Fab

  • Author

    Kaempf, Ulrich

  • Author_Institution
    Hewlett-Packard Co., Corvallis, OR, USA
  • fYear
    1997
  • fDate
    10-12 Sep 1997
  • Firstpage
    356
  • Lastpage
    361
  • Abstract
    Through simulations with models, HP´s Inkjet Supplies Business Unit has determined that intrabay material transport with automated delivery of wafers directly to process tools substantially increases the throughput of our semiconductor manufacturing facility (Fab). To fully utilize limited Fab space, an architecture using overhead track and vehicles has been selected. HP cooperated with a Supplier of automated material handling systems (AMHS) to develop this “zero footprint” solution. The experiences learned from a first-generation prototype system have been incorporated into a second generation prototype, which is currently being characterized at HP´s Corvallis site. Due to the long AMHS development cycle, the new Corvallis Fab started its operation with manual material transport, using SMIF pods as carrying containers. All process tools have been equipped with SMIF (Standard Mechanical Interface) load ports. Applying AEC (Automated Equipment Control) station controllers manage lot identification, WIP tracking and recipe selection. The SMIF industry standard for load port design, and AEC have proven to be valuable enablers to achieve AMHS with automated pod delivery and pick-up to and from process tools
  • Keywords
    materials handling; semiconductor device manufacture; AEC station controller; Corvallis Fab; HP Inkjet Supplies Business Unit; SMIF pod; WIP tracking; automated material handling system; intrabay material transport; model; overhead track; process tool; recipe selection; semiconductor fab; simulation; throughput; vehicle; wafer transport; zero footprint; Automatic control; Character generation; Manuals; Materials handling; Production facilities; Prototypes; Semiconductor device modeling; Semiconductor materials; Space vehicles; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-4050-7
  • Type

    conf

  • DOI
    10.1109/ASMC.1997.630762
  • Filename
    630762