Title :
Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller
Author :
Moro, N. ; Dehbaoui, Amine ; Heydemann, Karine ; Robisson, B. ; Encrenaz, Emmanuelle
Author_Institution :
Commissariat a l´Energie Atomique et aux Energies Alternatives (CEA), Gardanne, France
Abstract :
Injection of transient faults as a way to attack cryptographic implementations has been largely studied in the last decade. Several attacks that use electromagnetic fault injection against hardware or software architectures have already been presented. On micro controllers, electromagnetic fault injection has mostly been seen as a way to skip assembly instructions or subroutine calls. However, to the best of our knowledge, no precise study about the impact of an electromagnetic glitch fault injection on a micro controller has been proposed yet. The aim of this paper is twofold: providing a more in-depth study of the effects of electromagnetic glitch fault injection on a state-of-the-art micro controller and building an associated register-transfer level fault model.
Keywords :
cryptography; microcontrollers; software architecture; associated register-transfer level fault model; cryptographic implementations; electromagnetic fault injection; electromagnetic glitch fault injection; hardware architecture; microcontroller; software architecture; transient fault injection; word length 32 bit; Circuit faults; Clocks; Electromagnetics; Hardware; Microcontrollers; Probes; Registers; electromagnetic glitch; fault attack; fault model; microcontroller; timing fault;
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-0-7695-5059-6
DOI :
10.1109/FDTC.2013.9