Title :
AUTOTESTCON ´89 Conference Record: ´The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century´ (Cat. No.89CH2568-4)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
artificial intelligence; automatic test equipment; automatic testing; expert systems; maintenance engineering; military systems; modules; software engineering; ATE; artificial intelligence; automatic test equipment; built-in test; concurrent engineering; downsizing commercial instruments; embedded software; expert systems; inference; modular instrumentation; self-maintenance; software tools; two-level maintenance; vehicle BIT/BITE; vehicle technology;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/AUTEST.1989.81148
