Recent developments in ESD protection for RF ICs

Author

Wang, Albert

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

fYear

2003

fDate

21-24 Jan. 2003

Firstpage

171

Lastpage

178

Abstract

New challenge in ESD protection design for RF ICs is to address the complex interactions between the ESD protection network and the core circuit being protected in both directions. This paper reviews recent developments in RF ESD protection design, including switching and mis-triggering of ESD protection networks; ESD-induced parasitic capacitive, resistive, noise coupling and self-generated noise effects, RF ESD evaluation techniques; and low-parasitic compact RF ESD protection solutions.

Keywords

electrostatic discharge; integrated circuit design; integrated circuit noise; integrated circuit reliability; protection; radiofrequency integrated circuits; reviews; ESD protection design; ESD protection network; ESD-induced parasitic capacitive noise coupling; ESD-induced parasitic resistive noise coupling; RF ESD evaluation techniques; RF IC; core circuit interactions; low-parasitic compact RF ESD protection; mis-triggering; self-generated noise effects; switching; Circuit optimization; Circuit synthesis; Electrostatic discharge; High speed integrated circuits; Integrated circuit noise; Protection; Radio frequency; Radiofrequency integrated circuits; Switches; Variable structure systems;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific

Print_ISBN

0-7803-7659-5

Type

conf

DOI

10.1109/ASPDAC.2003.1195012

Filename

1195012