DocumentCode :
3398884
Title :
Research on aging characteristics of twisted pair based on dielectric loss under high frequency pulse voltage
Author :
Gao, Bo ; Wu, Guangning ; Zhou, Liren ; Cao, Kaijiang ; Luo, Yang
Author_Institution :
Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
fYear :
2009
fDate :
19-23 July 2009
Firstpage :
392
Lastpage :
395
Abstract :
This paper conducted experiment research on enameled wire used in inter-turn insulation of JD117 inverter-fed motor and focused on twisted pairs as test object. Bipolar pulse voltage aging test was conducted under various frequency and time; dielectric frequency and temperature spectra of specimen were measured and analyzed; combining with Scanning Electrical Microscope (SEM), the influence of different aging conditions on surface morphology were researched. The experiment results reveal that with the aging degree deepening, through analyzing frequency spectrum of tan delta, its peak value can be used to judge the insulation condition. There exists significant difference of surface morphology of twisted pair between non-aging and aging. That difference becomes increasingly evident with the deepening of aging degree.
Keywords :
ageing; dielectric losses; twisted pair cables; aging characteristics; aging degree; bipolar pulse voltage aging test; dielectric frequency; dielectric loss; enameled wire; frequency spectrum; high frequency pulse voltage; scanning electrical microscope; surface morphology; twisted pair; Aging; Cable insulation; Dielectric losses; Dielectrics and electrical insulation; Frequency; Pulse measurements; Scanning electron microscopy; Surface morphology; Voltage; Wire; Inverter-fed motor; aging; dielectric loss; dielectric spectrum; twisted pair;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
Type :
conf
DOI :
10.1109/ICPADM.2009.5252407
Filename :
5252407
Link To Document :
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