DocumentCode :
3399115
Title :
Linear dependency check in built-in test
Author :
Yang, Chyan
Author_Institution :
Dept. of Electr. & Comput. Eng., US Naval Postgraduate Sch., Monterey, CA, USA
fYear :
1991
fDate :
14-17 May 1991
Firstpage :
615
Abstract :
Given a characteristic polynomial and a sampling polynomial with respect to it, whether the sampling polynomial is a dependency polynomial is important to the designer. A dependency polynomial gives low fault coverage in the built-in self test. The tool LDC (linear dependency check) computes the residue combinations of the factors in the set polynomial and advises designers if the sampling polynomial covers all the testing space. When the sampling polynomial is a dependency polynomial, LDC will try to find one, if any, independent polynomial at a minimum cost. In cases of short test vectors, LDC can exhaustively enumerate all independent polynomials for the designers to choose from. The author reviews the basics of the linear dependency computation, explains the LDC capabilities and its usefulness, and discusses the computational issues of the problem
Keywords :
built-in self test; design for testability; fault location; polynomials; LDC; built-in test; characteristic polynomial; computational issues; dependency polynomial; fault coverage; linear dependency check; residue combinations; sampling polynomial; testing space; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Ear; Linear feedback shift registers; Polynomials; Sampling methods; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-0620-1
Type :
conf
DOI :
10.1109/MWSCAS.1991.252037
Filename :
252037
Link To Document :
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