• DocumentCode
    3399329
  • Title

    Influences of aggregative state on electrical trees growth characteristics under cryogenic condition

  • Author

    Gao, Wensheng ; Ding, Dengwei ; Yin, Qingduo

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    297
  • Lastpage
    300
  • Abstract
    The electrical trees aging processes in different kinds of polymer directly determine the insulation property; therefore the aggregative state in polymer insulation under cryogenic condition is specially focused in this paper. The results indicate that polymer brittleness plays an important role for electrical ageing under cryogenic condition as well as the mechanical destruction which is induced by PD. Thus the influence of aggregative state on aging processes is less obvious under cryogenic than that at room temperature. The crystallinity and average size of crystallite can both be decreased with the increase of cooling-down speed. The trees morphological properties imply that trees grow directly to the crystal regions under cryogenic condition and large branch with big space intervals can be formed with small size of crystals, which are also proofed in the samples after many times hot and cold circles treating.
  • Keywords
    cryogenics; insulation; trees (electrical); cryogenic condition; electrical trees aging processes; electrical trees growth characteristics; partial discharge; polymer insulation; temperature 293 K to 298 K; trees morphological properties; Aging; Cryogenics; Crystallization; Dielectrics and electrical insulation; Partial discharges; Plastic insulation; Polymers; Superconductivity; Temperature; Trees - insulation; cryogenic conditions; degradation and aging; electrical trees; partial discharge (PD); polymer insulations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252427
  • Filename
    5252427